TESCAN

doi:10.1017/S1551929522000219

TESCAN

Published online by Cambridge University Press: 25 March 2022

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Type: Company Profile
Information: Microscopy Today , Volume 30 , Supplement S1: 2022 Buyers' Guide , March 2022 , pp. 24

DOI: https://doi.org/10.1017/S1551929522000219 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2022

TESCAN’s SEM, FIB-SEM, and micro-CT instruments are capable of providing valuable insights into a broad range of scientific disciplines. From materials science to cellular biology, semiconductors, and geology, our instruments help unlock the secrets of “How” and “Why.”

TESCAN has developed state-of-the-art SEMs, FIB-SEMs, and micro-CTs that are capable of imaging with both high resolution and high contrast - some solutions will even enable observation of dynamic events in real-time. Furthermore, these systems have been designed to be extremely versatile, allowing customization of a system by adding imaging and microanalytical detection capabilities. This culmination of performance and versatility, produce intricate experimental capabilities that result in the most comprehensive analyses.

SEM, FIB-SEM and micro-CT solutions:

• TESCAN UniTOM HR - The first micro-CT system to provide sub-micron spatial resolution and high temporal resolution dynamic CT in a single system.
• TESCAN DynaTOM - Unique and first of its kind dedicated system for fast dynamic in situ imaging.
• TESCAN CLARA - BrightBeam™ Field-free analytical UHR-SEM for materials characterization at the nanoscale
• TESCAN SOLARIS - Triglav™ An ultimate resolution FIB-SEM workbench for advanced nanofabrication applications
• TESCAN SOLARIS X - Triglav™ A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis
• TESCAN AMBER - BrightBeam™ A field-free UHR-SEM combined with the most precise FIB for sample preparation, sub-surface and 3D analysis capabilities to take your materials nanocharacterization further
• TESCAN AMBER X - BrightBeam™ A unique combination of Plasma FIB and field-free UHR SEM for the widest range of multiscale materials characterization applications
• TESCAN TIMA - High speed measurement and analysis of large batches of mineralogy samples
• TESCAN MIRA - Field-emission SEM with a flexible platform. It is a high-resolution analytical SEM for routine materials characterization, research and quality control applications at the sub-micron scale.
• TESCAN VEGA - Analytical SEM for routine materials characterization, research and quality control applications at the micron scale.