Based on the discussion in Chapters 4 and 5, combining information from both electron microscopy, presumably (Scanning) Transmission Electron Microscopy ((S)TEM), and Atom Probe Tomography (APT) is a likely path toward ASAT. Experimentally, concurrent (S)TEM and APT may appear to be a straightforward experiment, but the instrumentation required can be complex and require significant capital investment. In this chapter, we consider what instrumentation is necessary for each technique and what could be done to both simplify and improve the ASAT technique in a combined instrument that solves many of the complexities in experimentation. Experimental conditions such as vacuum pressure, cryogenic temperatures, electron imaging and diffraction, laser wavelength and positioning, and specimen holder designs must all be taken into account.

This chapter begins with a formal definition of Atomic-Scale Analytical Tomography (ASAT) and the origins of the concept. The progression of experimental atomic-scale microscopies that led to ASAT concepts is reviewed, and the people and projects are highlighted. Once ASAT is established as a concept, its implications for structure-properties microscopy, coupled through Integrated Computational Materials Engineering (ICME), become obvious. A forward-looking roadmap for ASAT considers what length scales and atom counts in ASAT images are needed to address important microstructural questions. The chapter concludes with the notion that microscopy is at an inflection point: having reached the ultimate building blocks, the drive to see smaller and smaller must now evolve to a drive to see more and more of a structure.