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1 results

  • Adhesive-Based Atom Probe Sample Preparation

  • Surya S. Rout, Philipp R. Heck, Nestor J. Zaluzec, Dieter Isheim, Dean J. Miller, David N. Seidman
  • Journal:
    Microscopy Today / Volume 26 / Issue 2 / March 2018
    Published online by Cambridge University Press:
    15 March 2018, pp. 24-31
    Print publication:
    March 2018
    • Article
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  • We present a specimen preparation procedure for atom-probe tomography using SemGlu from Kleindiek Nanotechnik, an adhesive that hardens under electron beam irradiation. The SemGlu adhesive is used in place of focused-ion-beam-induced deposition of organo-metallic Pt, W, or C to form a bond between the sample and the substrate during the specimen preparation procedure. We demonstrate the utility of this adhesive-based specimen preparation technique with a correlated atom-probe tomography-scanning transmission electron microscopy study of the iron-nickel alloy kamacite (ferrite, ɑ-iron) in the Bristol iron meteorite and two steel specimens.