In the building domain, components or equipment are often subjected to severeenvironmental conditions. In order to predict the reliability and the life-time of suchequipment, accelerated life testing can be carried out. Severe conditions are applied toaccelerate the ageing of the components and the reliability at nominal conditions is thendeduced considering that these nominal conditions are not constant but stochastic. In thispaper, the accelerated life testing of photovoltaic modules is carried out at severemodule temperature levels. The module power losses are monitored and the limit state isdetermined when a threshold power is reached. The stochastic data and the reliability aresimulated during a period of twenty years. Finally, the life time of the component isevaluated.
