Scanning probe microscopies (SPM) have opened the window into characterization of nanoscale functionalities of a broad panoply of materials and devices. This lecture series summarizes the principles, theoretical basis, techniques, and applications of piezoresponse force microscopy and electrochemical strain microscopies, the SPM techniques based on the electromechanical detection. The image formation mechanisms, spectroscopic and excitation modes, imaging in ambient, liquid, and vacuum environments and associated artifacts are discussed, as are application to broad ranges of materials systems from ferroelectrics to energy and information technology materials to biological systems. The lectures are available at YouTube: https://www.youtube.com/playlist?list=PLS6ZvEWHZ3OPifI9LVKnHX7tK38iTltOD.
