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Internal Electric Field Profiling of 2D P-N Junctions of Semiconductor Devices by 4D STEM and Dual Lens Electron Holography
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- Journal:
- Microscopy Today / Volume 30 / Issue 1 / January 2022
- Published online by Cambridge University Press:
- 31 January 2022, pp. 24-29
- Print publication:
- January 2022
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