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one-sided tolerance process

International Journal of Metrology and Quality Engineering (1)

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1 results

Testing capability indices for one-sided processeswith measurement errors
D. Grau
Journal:

International Journal of Metrology and Quality Engineering / Volume 4 / Issue 2 / 2013

Published online by Cambridge University Press:

07 November 2013, pp. 71-80

Print publication:

2013
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In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices Cpu (u, v) and Cpl (u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. This assumption insufficiently reflects real situations even when advanced measuring instruments are used. In this paper we show that using a critical value without taking into account these errors, severely underestimates the α-risk which causes a less accurate testing capacity. In order to improve the results we suggest the use of an adjusted critical value, and we give a Maple program to get it. An example in a polymer granulates manufactory is presented to illustrate this approach.