In this paper, a new design of an optoelectronic system for transient waveforms shaping, with a selection of rejected frequencies, is presented. The generation of short pulses is performed with several optoelectronic generators using photoconductive semiconductor switches (PCSS) operating in linear switching mode and triggered via a laser pulse. With the appropriate number of generators, the system generates a spectrum ranging from 300 MHz to 3 GHz, with rejected frequencies at 900 MHz and 1.8 GHz. A PCSS characterization has been set up to determine the necessary parameters for the establishment of an optoelectronic generator model on Keysight Advanced Design System software (ADS). Experimental tests have been realized using measurement benches to compare the simulated and measured signals.

We discuss the application of ion microscopy and in situ electron microscopy to the study of electronic and optical materials and devices. We demonstrate how the combination of in situ transmission electron microscopy and focused ion beam microscopy provides new avenues for the study for such structures, enabling extension of these techniques to the study of dopant distributions, nanoscale stresses, three-dimensional structural and chemical reconstruction, and real-time evolution of defect microstructure. We also discuss in situ applications of thermal, mechanical, electrical, and optical stresses during transmission electron microscopy imaging.