The main difficulty in the quantitative mineral analysis of rocks is connected with the variable nature of the mineral species. In the present paper a combined method (and a corresponding computer program) is proposed, which practically overcomes this difficulty. This method is based on linear equations, which are a combination of the chemical mass-balance equations with those of the quantitative X-ray diffractometry, and can perform (completely or partly) both the quantification and the chemical characterization of the minerals on several rock samples simultaneously, demanding only easily accessible initial information, such as: (i) major element (oxide) compositions for the samples; (ii) qualitative mineral composition of the samples; (iii) X-ray intensities for one or few nonoverlapped reflections of the crystalline minerals (not necessarily of all): (iv) some characteristic data for the phases (i.e., chemical composition data), if these are accurately known. Where it is possible the minerals may be expressed via end members. The samples may contain amorphous phases and/or phases without X-ray data. From the general case some very simple partial cases are derived, demanding less initial information. This method has the following advantages over the previous ones of similar philosophy: (i) drastic reduction of the number of required samples; (ii) sufficiency of equations for any analytical problem; (iii) possibility of performing partial analysis when a complete one is impossible; (iv) possibility of using the same end member in more than one solid solution. Analysis examples are given.

A calibration procedure for the detection efficiency of energy dispersive X-ray spectrometers (EDS) used in combination with scanning electron microscopy (SEM) for standardless electron probe microanalysis (EPMA) is presented. The procedure is based on the comparison of X-ray spectra from a reference material (RM) measured with the EDS to be calibrated and a reference EDS. The RM is certified by the line intensities in the X-ray spectrum recorded with a reference EDS and by its composition. The calibration of the reference EDS is performed using synchrotron radiation at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt. Measurement of RM spectra and comparison of the specified line intensities enables a rapid efficiency calibration on most SEMs. The article reports on studies to prepare such a RM and on EDS calibration and proposes a methodology that could be implemented in current spectrometer software to enable the calibration with a minimum of operator assistance.

Results for the X-ray emission efficiency (counts per C per sr) of K-lines for selected elements (C, Al, Si, Ti, Cu, Ge) and for the first time also for compounds and alloys (SiC, GaP, AlCu, TiAlC) are presented. An energy dispersive X-ray spectrometer (EDS) of known detection efficiency (counts per photon) has been used to record the spectra at a takeoff angle of 25° determined by the geometry of the secondary electron microscope's specimen chamber. Overall uncertainty in measurement could be reduced to 5 to 10% in dependence on the line intensity and energy. Measured emission efficiencies have been compared with calculated efficiencies based on models applied in standardless analysis. The widespread XPP and PROZA models give somewhat too low emission efficiencies. The best agreement between measured and calculated efficiencies could be achieved by replacing in the modular PROZA96 model the original expression for the ionization cross section by the formula given by Casnati et al. (1982) A discrepancy remains for carbon, probably due to the high overvoltage ratio.