We developed a novel electron-diffraction technique by focusing a
small probe above (or below) the sample in an electron microscope to
measure charge density and lattice displacement in technologically
important materials. The method features the simultaneous acquisition
of shadow images within many Bragg reflections, resulting in parallel
recording of dark-field images (PARODI). Because it couples diffraction
with images, it is thus suitable for studying crystals as well as their
defects. We used this technique to accurately locate the
charge-carrying holes in superconducting crystals, and to determine
displacement vectors across planar faults by comparing the experiments
with calculations, and by using fitting and error analyses. Examples
are given for complex YBa2Cu3O7 and
Bi2Sr2CaCu2O8+δ oxides
and the newly discovered MgB2 superconductor.