A partition calculation method (PCM) for calculating the diffraction efficiency of multilayer Fresnel zone plate with high aspect ratio is proposed. In contrast to the traditional theory, PCM designs and evaluates Fresnel zone plate (FZP) considering material pairs, all zone widths, thicknesses and X-ray energy more completely. The results obtained through PCM are validated by comparing them with the complex amplitude superposition theory and coupled wave theory numerical results. The PCM satisfies the requirements of the theoretical investigation of FZP with small outermost zone width (drN) and large thickness (t). Combining proper numerical analysis with the experimental conditions will present a great potential to break through the imaging performance of X-ray microscopy.

A commercial Empyrean X-ray diffractometer was adapted for combined grazing incidence X-ray fluorescence analysis (GIXRF) measurements with X-ray reflectivity (XRR) measurements. An energy-dispersive silicon drift detector was mounted and integrated in the angle-dependent data acquisition of the Empyrean. Different monochromator/X-ray optics units have been compared with the values obtained by the Atominstitut GIXRF + XRR spectrometer. Data evaluation was performed by JGIXA, a special software for combined GIXRF + XRR data fitting, developed at Atominstitut. A sample consisting of a ~50 nm nickel layer on a silicon substrate was used to compare the performance criteria (i.e. divergence and intensity) of the incident beam optics. An Empyrean X-ray diffractometer was successfully refitted to measure both GIXRF and XRR data.

K α X-ray sources generated from the interaction of ultra-short laser pulses with solids are compact and low-cost source of ultra-short quasi-monochromatic X-rays compared with synchrotron radiation source. Development of collimated ultra-short K α X-ray source by the interaction of 45 fs Ti:sapphire laser pulse with Cu wire target is presented in this paper. A study of the K α source with laser parameters such as energy and pulse duration was carried out. The observed K α X-ray photon flux was ~2.7 × 108 photons/shot at the laser intensity of ~2.8 × 1017 W cm−2. A model was developed to analyze the observed results. The K α radiation was coupled to a polycapillary collimator to generate a collimated low divergence (0.8 mrad) X-ray beam. Such sources are useful for time-resolved X-ray diffraction and imaging studies.

The overview of the recent results for discovery and investigations of a very exotic phenomenon – optical mirage in the X-ray spectral range – is presented. It was found that the mirage could be created in the form of coherent virtual point source, emerging in the vicinity of the second plasma in two-stage oscillator-amplifier X-ray laser. The X-ray source-mirage, rigidly phased with the initial radiation of generator, occurs only when amplification takes place in the amplifier plasma and leads to the appearance of the interference pattern in the form of concentric rings in the spatial profile of the output X-ray laser beam. The equation describing the emergence of X-ray mirage was found, numerical solution of which shows that its formation is similar to that of the optical mirages observed at propagation of light rays through an inhomogeneously heated air. Obtained results have already demonstrated novel comprehension into the physical nature of amplification of X-ray radiation, opening additional opportunities for X-ray interferometry, holography, and other applications, which require multiple rigidly phased sources of coherent radiation.

Polycapillary optics are utilized in a wide variety of applications and are integral components in many state of the art instruments. Polycapillary optics operate by collecting X-rays and efficiently propagating them by total external reflection to form focused and parallel beams. We discuss the general parameters for designing these optics and provide specific examples on balancing the interrelations of beam flux, source size, focal spot-size, and beam divergence. The development of compact X-ray sources with characteristics tailored to match the requirements of polycapillary optics allows substantial reduction in size, weight, and power of complete X-ray systems. These compact systems have enabled the development of portable, remote, and in-line sensors for applications in industry, science and medicine. We present examples of the utility and potential of these optics for enhancing a wide variety of X-ray analyses.

We have developed a compact, 14.7 nm, sub-5 ps X-ray laser source at Lawrence Livermore National Laboratory (LLNL) together with a Mach-Zehnder type diffraction grating interferometer built at Colorado State University for probing dense, high intensity laser-produced plasmas. The short wavelength and pulse length of the probe reduces refraction, absorption effects within the plasma and minimizes plasma motion blurring. This unique diagnostic capability gives precise two-dimensional (2D) density profile snapshots and is generating new data for rapidly evolving laser-heated plasmas. A review of the results from dense, mm-scale line focus plasma experiments will be described with detailed comparisons to hydrodynamic simulations.

Ray-tracing simulations of an optical X-ray system based on a spherically bent crystal operating in Bragg configuration for monochromatic projection imaging of thin samples are presented, obtained using a code developed for that purpose. The code is particularly suited for characterizing experimental arrangements routinely used with laser-produced plasma X-ray sources. In particular, the spatial resolution of the imaging system was investigated and a careful study of the complex pattern of the X-ray backlighting beam was performed.

New easy spectrally tunable backlighting schemes based on a spherically bent crystal are considered. Contrary to traditional backlighting scheme, in which the investigated objects should be placed between the backlighter and the crystal, for the considered schemes an object is placed downstream of the crystal, before the tangential or after the sagittal focus and an image of the object is recorded at the distance from the object corresponding to the needed magnification. The magnification is defined by the ratio of the distances from the sagittal focus to the detector and from the object to the sagittal focus. A ray-tracing modeling and experimental images of test meshes, obtained at incidence angles of the backlighter radiation of 10° and 22°, are presented. It is demonstrated that a simple linear transformation of the obtained astigmatic images allows reconstructing them as a stigmatic with an accuracy of 5–15%. For the spectral range around 9 Å a spatial resolution about 10 μm in a field of view of some square millimeters is achieved experimentally and confirmed by ray-tracing simulations.

This issue of MRS Bulletin focuses on the rapid progress that is ongoing in the development of hard x-ray microscopies with three-dimensional spatial resolutions ranging from micrometers to nanometers. The individual articles provide a crosscut of developments in hard x-ray projection tomography microscopy for imaging density and chemical fluctuations in crystalline and noncrystalline materials; large-angle diffractionbased, spatially resolved imaging of local structure, orientation, and strain distributions in crystalline materials; and emerging coherent diffraction imaging for nanometer-range Fourier transform imaging of crystalline and noncrystalline materials.

The shadow monochromatic backlighting (SMB) scheme, a modification of the well-known soft X-ray monochromatic backlighting scheme, is proposed. It is based on a spherical crystal as the dispersive element and extends the traditional scheme by allowing one to work with a wide range of Bragg angles and thus in a wide spectral range. The advantages of the new scheme are demonstrated experimentally and supported numerically by ray-tracing simulations. In the experiments, the X-ray backlighter source is a laser-produced plasma, created by the interaction of an ultrashort pulse, Ti:Sapphire laser (120 fs, 3–5 mJ, 1016 W/cm2 on target) or a short wavelength XeCl laser (10 ns, 1–2 J, 1013 W/cm2 on target) with various solid targets (Dy, Ni + Cr, BaF2). In both experiments, the X-ray sources are well localized spatially (∼20 μm) and are spectrally tunable in a relatively wide wavelength range (λ = 8–15 Å). High quality monochromatic (δλ/λ ∼ 10−5–10−3) images with high spatial resolution (up to ∼4 μm) over a large field of view (a few square millimeters) were obtained. Utilization of spherically bent crystals to obtain high-resolution, large field, monochromatic images in a wide range of Bragg angles (35° < Θ < 90°) is demonstrated for the first time.

Castaing’s successful implementation and application of the electron probe microanalyzer in 1950 stimulated a flurry of development activity around the world. The later versions of this instrument represented a truly international effort, with significant contributions by scientists from Europe, Asia, and North America. If the probe-forming system of the instrument was its heart, the X-ray wavelength spectrometer was its soul. This article reviews some of the history of spectrometer developments—lthrough the “golden years” of microprobe development, namely the dozen or so years following the publication of Castaing’s thesis, to the present. The basic physics of spectrometer and crystal design is reviewed. Early experimental devices, such as those developed by Castaing, Borovskii, Wittry, Duncumb, and Ogilvie are reported. Examples of commercial spectrometers such as those by ARL, MAC, Microspec, and Peak are described. Recent developments such as the combination of grazing-incidence optics with flat crystal spectrometers are noted, and the properties and uses of doubly curved crystals are discussed. Finally, the continued development of doubly curved crystal configurations, such as the “Wittry geometry” for scanning monochromators, and point-to-point focusing diffractors for producing small monochromatic X-ray probes to provide improved detection limits for microanalysis are considered.