Skip to main content Accessibility help
×
Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-26T07:25:46.825Z Has data issue: false hasContentIssue false

6 - Sensors, Instrumentation and Test Support Hardware

Published online by Cambridge University Press:  19 June 2020

Eric A. Silk
Affiliation:
University of Maryland, College Park
Get access

Summary

In most engineering applications, physical measurements are relied upon to gauge the performance and state of health (SOH) of a system during operation, as well as to collect data. The level of detail for any measurement depends on how critical it is; it follows that determination of physical phenomena will only be as good as the quality of the measurements taken during the design, build, test and flight of space systems. Quality measurements providing insight into the SOH of the system, as well as phenomena occurring in the surrounding environment, can be used to identify performance issues should they arise. Sensors, instrumentation and test support equipment (ground based) are the tools used to validate system performance in a space-relevant environment prior to launch, as well as to perform measurements during actual space flight. This chapter provides an overview of the measurement technologies, guidelines and associated test hardware used in the test and operation of spaceflight systems.

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2020

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

“ANSI and IEC Color Codes for Thermocouples, Wire and Connectors,” Thermocouples, Omega Engineering, Stamford, CTGoogle Scholar
“Thermistor Elements,” Thermistors, Omega Engineering, Stamford, CTGoogle Scholar
“Sensor Selection Guide,” Sensors, Lake Shore Cryotronics, Inc., Westerville, OHGoogle Scholar
“Temperature Sensor Selection Guide,” Sensors, Lake Shore Cryotronics, Inc., Westerville, OHGoogle Scholar
Horacek, B., Kiger, K., and Kim, J., 2005, “Single Nozzle Spray Cooling Heat Transfer Mechanisms,” International Journal of Heat and Mass Transfer, Vol. 48, pp. 14251438Google Scholar
Moseley, S.H., Mather, J.C., and McCammon, D., 1984, “Thermal Detectors As X-ray Spectrometers,” NASA-TM-86092Google Scholar
Alsop, D.C., Inman, C., Lange, A.E., and Wilbanks, T., 1992, “Design and Construction of High-sensitivity Infrared Bolometers for Operation at 300 mK,Applied Optics, Vol. 31, No. 31, pp. 66106615Google Scholar
Richards, P.L., 1994, “Bolometers for Infrared andMmillimeter waves,Journal of Applied Physics, Vol. 76, No. 4, pp. 124Google Scholar
Kraus, H., 1996, “Superconductive Bolometers and Calorimeters”, Superconducting Science and Technology, Vol. 9, pp. 827842Google Scholar
Enss, C., and McCammon, D., 2008, “Physical Principles of Low Temperature Detectors: Ultimate Performance Limits and Current Detector Capabilities,Journal of Low Temperature Physics, Vol. 151, pp. 524CrossRefGoogle Scholar
Langley, S.P., 1880, “The Bolometer and Radiant Energy,” Proceedings of the American Academy of Arts and Sciences, Vol. 16, pp. 342358. doi:10.2307/25138616Google Scholar
“Introduction to Vacuum Technology,” Vacuum Technology Book Vol. II, Pfeiffer Vaccum GmBH, Asslar, Hesse, GermanyGoogle Scholar
“Basic Calculations,” Vacuum Technology Book Vol. II, Pfeiffer Vaccum GmBH, Asslar, Hesse, GermanyGoogle Scholar
Umrath, W., Adam, H., Bolz, A., Boy, H., Dohmen, H., Gogol, K., Jorisch, W., Mönning, W., Mundinger, H.-J., Otten, H.-D., Scheer, W., Seiger, H., Schwarz, W., Stepputat, K., Urban, D., Wirtzfeld, H.-J., and Zenker, H.-J., 2016, “Fundamentals of Vacuum Technology,” Oerlikon, Cologne, GermanyGoogle Scholar
Barron, R.F., 1985, Cryogenic Systems, 2nd edn, Oxford University Press, New York, NYGoogle Scholar
O’Hanlon, J.F., 2003, A User’s Guide to Vacuum Technology, 3rd edn, John Wiley & Sons, Inc., New York, NYGoogle Scholar
Serway, R.A., 1986, Physics for Scientists & Engineers, Saunders College Publishing, Philadelphia, PAGoogle Scholar
Kline, S.J., and McClintock, F.A., 1953, “Describing Uncertainties in Single Sample Experiments,Journal of the Society of Mechanical Engineers, Vol. 56, No. 1, pp. 38Google Scholar

Save book to Kindle

To save this book to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×