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9 - Bridging the Local to Laboratory Frames in SHG and SFG Microscopy

Published online by Cambridge University Press:  04 May 2017

Garth J. Simpson
Affiliation:
Purdue University, Indiana
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Publisher: Cambridge University Press
Print publication year: 2017

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References

9.6 Further Reading

Azzam, R. M. A.; Bashara, N. M., Ellipsometry and Polarized Light. Elsevier: Amsterdam, 1987.Google Scholar
Saleh, B. E. A.; Teich, M. C., Fundamentals of Photonics. John Wiley & Sons: New York, 1991.Google Scholar
Plocinik, R. M.; Simpson, G. J., Polarization characterization in surface second harmonic generation by nonlinear optical null ellipsometry. Anal. Chim. Acta 2003, 496, 133142.CrossRefGoogle Scholar
Plocinik, R. M.; Everly, R. M.; Moad, A. J.; Simpson, G. J., A modular ellipsometric approach for mining structural information from nonlinear optical polarization analysis. Phys. Rev. B 2005, 72, 125409.CrossRefGoogle Scholar
Begue, N. J.; Everly, R. M.; Hall, V. J.; Haupert, L.; Simpson, G. J., Nonlinear optical stokes ellipsometry. 2. Experimental demonstration. J. Phys. Chem. C 2009, 113 (23), 1016610175.CrossRefGoogle Scholar
Begue, N. J.; Moad, A. J.; Simpson, G. J., Nonlinear optical stokes ellipsometry. 1. Theoretical framework. J. Phys. Chem. C 2009, 113 (23), 1015810165.CrossRefGoogle Scholar
(a)Polizzi, M. A.; Plocinik, R. M.; Simpson, G. J., Ellipsometric approach for the real-time detection of label-free protein adsorption by second harmonic generation. J. Am. Chem. Soc. 2004, 126, 50015007.Google ScholarGoogle Scholar
Yew, E. Y. S.; Sheppard, C. J. R., Effects of axial field components on second harmonic generation microscopy. Opt. Expr. 2006, 14 (3), 11671174.Google Scholar
Wang, X. H.; Chang, S. J.; Lin, L.; Wang, L. R.; Huo, B. Z.; Hao, S. J., Vector model for polarized second-harmonic generation microscopy under high numerical aperture. J. Opt. 2010, 12 (4), 8.Google Scholar
Maker, P. D.; Terhune, R. W.; Nisenoff, M.; Savage, C. M., Effects of dispersion and focusing on the production of optical harmonics. Phys. Rev. Lett. 1962, 8 (1), 21.CrossRefGoogle Scholar

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