Published online by Cambridge University Press: 24 September 2021
Chapter 6 describes a range of methods to determine different aspects of the electronic structure of materials. These include both core level photoemission (and the associated 'chemical' shifts) and valence band photoemission, notably including angle-resolved photoelectron spectroscopy (ARPES). The use of X-ray absorption near-edge structures (XANES) and the related technique of X-ray magnetic circular dicroism (XMCD) using circularly-polarised radiation is also described, as is the use of X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS) and Compton scattering. Finally, the use of photoemission and photoionisation to investigate gas-phase molecular structure is described.
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