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Answering questions in materials science using FIB/SEM dual beam methods

Published online by Cambridge University Press:  07 September 2007

C Holzapfel ,
F Soldera  and
F Mücklich
C Holzapfel
Affiliation:
SCHLEIFRING und APPARATEBAU GmbH and Universität des Saarlandes, Germany
F Soldera
Affiliation:
Universität des Saarlandes, Germany
F Mücklich
Affiliation:
Universität des Saarlandes, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 86 - 87
Copyright
Copyright © Microscopy Society of America 2007

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