Microscopy and Microanalysis: Volume 13 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 13 - Issue S03 - September 2007

Contents

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Research Article

The development of EOD program for the design of electron optical devices
Lencová B, Zlámal J
Published online by Cambridge University Press:

07 September 2007, pp. 2-3
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

First Experimental Results with Advanced Hexapole Cs-Correctors
Hartel P, Müller H, Uhlemann S, Haider M
Published online by Cambridge University Press:

07 September 2007, pp. 4-5
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

A new monochromated and illumination-CS-corrected HR(S)TEM: First applications in material sciences
Irsen S, Kelm K, Schillinger R, Schmidt H, Mader W, Schmalzried C, Telle R, Quandt E
Published online by Cambridge University Press:

07 September 2007, pp. 6-7
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Contrast Enhancement by Anamorphotic Phase Plates in an Aberration Corrected TEM
R R Schröder, B Barton, H Rose, G Benner
Published online by Cambridge University Press:

07 September 2007, pp. 8-9
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

Optimisation of Phase Contrast in a Transmission Electron Microscope with a Physical Phase Plate and Cs-Corrector
B Gamm, Schultheiss K, Gerthsen D, Schröder R R
Published online by Cambridge University Press:

07 September 2007, pp. 10-11
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Verification of Electron Magnetic Chiral Dichroism in a TEM by Reversing the Specimen's Magnetisation
Hurm C, Zweck J, Stöger-Pollach M, Rubino S, Hébert C, Schattschneider P
Published online by Cambridge University Press:

07 September 2007, pp. 12-13
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Advanced Low Energy Focused Ion Beam Design Based on Immersion Optics
Rauscher M, Marianowski K, Degel B, Plies E
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07 September 2007, pp. 14-15
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Development of an Ion Optical System to transfer Secondary Ions from the Sample to an Ion Trap Mass Spectrometer
Schröppel B, Plies E, Burkhardt C, Brekenfeld A, Zeile U, Gnauck P
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07 September 2007, pp. 16-17
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Analytical Performance of the SESAM Microscope
Essers E, Matijevic M, Benner G, Höschen R, Sigle W, Koch C
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07 September 2007, pp. 18-19
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Nanorobotics for Scanning Electron and Ion Microscopy
Offern S van, Klocke V
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07 September 2007, pp. 20-21
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Substitution of Atomic Scattering Amplitudes in TEM Interpretation by Analytic Bond Order Potentials
Scheerschmidt K, Kuhlmann V
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07 September 2007, pp. 22-23
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

A Local Absorptive Potential Multislice Approximation to Calculate Intensity Contributions from Thermal Diffuse Scattering in Conventional TEM
Rosenauer A
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07 September 2007, pp. 24-25
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

The Statistics of the Thermal Motion of the Atoms in TEM Imaging
Rother A, Lichte H, Gemming T
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07 September 2007, pp. 26-27
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Phase Contrast and HAADF Imaging of Structures in In2O3–ZnO Compounds in CS-Corrected Electron Microscopes
Yu W, Mader W, Houben L, Tillmann K
Published online by Cambridge University Press:

07 September 2007, pp. 28-29
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Imaging Light Atoms at Sub-Ångström Resolution in an Image Side CS-Corrected Electron Microscope FEI Titan 80-300
Svete M, Mader W, Houben L, Tillmann K
Published online by Cambridge University Press:

07 September 2007, pp. 30-31
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Optimum Imaging Conditions for Recording High-Resolution Electron Holograms in a Cs-corrected TEM
Linck M
Published online by Cambridge University Press:

07 September 2007, pp. 32-33
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Structural investigation of amorphous/crystalline interfaces by iterative image series matching
Thiel K, Niermann T, Seibt M, Borgardt N I
Published online by Cambridge University Press:

07 September 2007, pp. 34-35
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Improved Performance of Electron Holography with Tecnai F20 Cs-corr
D Geiger, H Lichte, M Linck, M Lehmann, B Freitag, M Haider
Published online by Cambridge University Press:

07 September 2007, pp. 36-37
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

Studies of core structures and strain fields of extended defects in GaN using Exit-Wave-Reconstruction and numerical correction of lens aberrations
Niermann T, Mai D, Roever M, Malindretos J, Rizzi A, Seibt M
Published online by Cambridge University Press:

07 September 2007, pp. 38-39
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

A Relativistic Formalism and the Small Angle Approximation of Elastic Electron Scattering in TEM
Rother A, Scheerschmidt K
Published online by Cambridge University Press:

07 September 2007, pp. 40-41
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Page 1 of 12

First
« Prev
1
2
3
4
5
6
7
Next »
Last

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 13 - Issue S03 - September 2007

Research Article

The development of EOD program for the design of electron optical devices

First Experimental Results with Advanced Hexapole Cs-Correctors

A new monochromated and illumination-CS-corrected HR(S)TEM: First applications in material sciences

Contrast Enhancement by Anamorphotic Phase Plates in an Aberration Corrected TEM

Optimisation of Phase Contrast in a Transmission Electron Microscope with a Physical Phase Plate and Cs-Corrector

Verification of Electron Magnetic Chiral Dichroism in a TEM by Reversing the Specimen's Magnetisation

Advanced Low Energy Focused Ion Beam Design Based on Immersion Optics

Development of an Ion Optical System to transfer Secondary Ions from the Sample to an Ion Trap Mass Spectrometer

Analytical Performance of the SESAM Microscope

Nanorobotics for Scanning Electron and Ion Microscopy

Substitution of Atomic Scattering Amplitudes in TEM Interpretation by Analytic Bond Order Potentials

A Local Absorptive Potential Multislice Approximation to Calculate Intensity Contributions from Thermal Diffuse Scattering in Conventional TEM

The Statistics of the Thermal Motion of the Atoms in TEM Imaging

Phase Contrast and HAADF Imaging of Structures in In2O3–ZnO Compounds in CS-Corrected Electron Microscopes

Imaging Light Atoms at Sub-Ångström Resolution in an Image Side CS-Corrected Electron Microscope FEI Titan 80-300

Optimum Imaging Conditions for Recording High-Resolution Electron Holograms in a Cs-corrected TEM

Structural investigation of amorphous/crystalline interfaces by iterative image series matching

Improved Performance of Electron Holography with Tecnai F20 Cs-corr

Studies of core structures and strain fields of extended defects in GaN using Exit-Wave-Reconstruction and numerical correction of lens aberrations

A Relativistic Formalism and the Small Angle Approximation of Elastic Electron Scattering in TEM

Microscopy and Microanalysis

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Volume 13 - Issue S03 - September 2007

Research Article