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Atom Probe Tomography as a Tool for Characterizing Irradiated Materials

Published online by Cambridge University Press:  01 August 2010

MK Miller ,
KF Russell ,
DT Hoelzer ,
L Kovarik ,
MJ Mills ,
AG Certain  and
TR Allen
MK Miller
Affiliation:
Oak Ridge National Laboratory
KF Russell
Affiliation:
Oak Ridge National Laboratory
DT Hoelzer
Affiliation:
Oak Ridge National Laboratory
L Kovarik
Affiliation:
The Ohio State University
MJ Mills
Affiliation:
The Ohio State University
AG Certain
Affiliation:
University of Wisconsin, Madison
TR Allen
Affiliation:
University of Wisconsin, Madison

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1602 - 1603
Copyright
Copyright © Microscopy Society of America 2010