Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 16 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 16 - Supplement S2 - July 2010

Contents

Page 1 of 50

Instrumentation and Techniques Symposia

Vendor Symposium: Creating the Tools for Science

Abstract

  • News on Silicon Drift Detectors for X-Ray Nanoanalysis in S/TEM

  • M Falke, R Kroemer, D Fissler, M Rohde
  • Published online by Cambridge University Press:
    01 August 2010, pp. 2-3
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • X-ray Imaging and Microtomography Integrated into the SEM: XuM Examples from Biology

  • P Mainwaring
  • Published online by Cambridge University Press:
    01 August 2010, pp. 4-5
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Stable Cold-Field Emission from Tungsten (310) in an SEM Gun with an Additional Non-Evaporative Getter Pump

  • K Kasuya, M Kimura, S Katagiri, T Ohshima
  • Published online by Cambridge University Press:
    01 August 2010, pp. 6-7
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advantages of Large Area SDD Detectors for Analysis in Analytical TEMs

  • N Rowlands, S Yamaguchi, M Ishida
  • Published online by Cambridge University Press:
    01 August 2010, pp. 8-9
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Optimized Laser Thermal Pulsing of Atom Probe Tomography: LEAP 4000X™

  • J Bunton, J Olson, D Lenz, DJ Larson, TF Kelly
  • Published online by Cambridge University Press:
    01 August 2010, pp. 10-11
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Leica EM VCT100 Versatile Cryo Transfer System

  • K Rensing
  • Published online by Cambridge University Press:
    01 August 2010, pp. 12-13
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cross-section of Asbestos Prepared for TEM/STEM with Ion Slicer

  • I Ohnishi, H Nishioka, E Okunishi, H Takahashi, Y Kondo
  • Published online by Cambridge University Press:
    01 August 2010, pp. 14-15
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Sample Repositioning Solutions for in situ Preparation and Analysis

  • C Hartfield, M Hammer, G Amador, T Moore
  • Published online by Cambridge University Press:
    01 August 2010, pp. 16-17
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Rapid High Resolution Combined AFM and Raman Microanalysis

  • T Tague, Jr, D Sampson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 18-19
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advanced Imaging and Separation Tools Based on Ultra-thin Porous Silicon Membranes

  • TR Gaborski, CC Striemer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 20-21
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Novel Time-Resolved Fluorescence Microscope System Using TCSPC and Multi-Frequency Techniques

  • L Chandler, JR Mattheiss
  • Published online by Cambridge University Press:
    01 August 2010, pp. 22-23
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microscopy in the 64-bit age

  • J Wilbrink, R Harmon
  • Published online by Cambridge University Press:
    01 August 2010, pp. 24-25
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Neon Gas Field Ion Source - Stability and Lifetime

  • J Notte, F Rahman, SM McVey, S Tan, R Livengood
  • Published online by Cambridge University Press:
    01 August 2010, pp. 28-29
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Increased Microanalysis Lab Productivity: Automation, Integration and Speed

  • N Bulloss
  • Published online by Cambridge University Press:
    01 August 2010, pp. 30-31
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advanced Surface Characterisation with X-ray Photoelectron Spectroscopy

  • P Mack, TS Nunney, RG White, J Wolstenholme, A Wright
  • Published online by Cambridge University Press:
    01 August 2010, pp. 32-33
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 3 Dimensional Microscopy, Serial Block Face SEM

  • J Mancuso
  • Published online by Cambridge University Press:
    01 August 2010, pp. 36-37
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Complimentary Fluorescence Lifetime and Raman Microscopy Methods for Cellular Imaging

  • K Gall, E Lee
  • Published online by Cambridge University Press:
    01 August 2010, pp. 38-39
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Overview of Electron Sources and Stability Improvements on Vogel Mounted Thermal Sources

  • W Mackie, G Magera, CL Fast
  • Published online by Cambridge University Press:
    01 August 2010, pp. 40-41
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 1 of 50