Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-14T05:23:26.472Z Has data issue: false hasContentIssue false
  • English
  • Français

Challenges and Opportunities in Characterizing Modern Nano-Devices

Published online by Cambridge University Press:  01 August 2010

L Pan ,
X Lin ,
B Miner  and
K Johnson
L Pan
Affiliation:
Intel Corporation
X Lin
Affiliation:
Intel Corporation
B Miner
Affiliation:
Intel Corporation
K Johnson
Affiliation:
Intel Corporation

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1906 - 1907
Copyright
Copyright © Microscopy Society of America 2010