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Etching and High-Resolution Backscatter Electron Imaging for Semi-Automated Segmentation and Stereology of the Gamma Prime Phase in Ni-based Superalloys
Published online by Cambridge University Press:
01 August 2010
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.