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Microfabricated systems for electron microscopy of nanoscale processes: In-situ TEM creation of Si nanowire devices and in-situ SEM electrochemistry

Published online by Cambridge University Press:  01 August 2010

K Mølhave ,
C Kallesøe ,
CY Wen ,
FM Ross ,
T Booth ,
T Kjøller Nellemann ,
E Jensen ,
CF Elkjær ,
JL Rasmussen  and
PS Jensen
...Show all authors
K Mølhave
Affiliation:
Technical University of Denmark
C Kallesøe
Affiliation:
Technical University of Denmark
CY Wen
Affiliation:
Purdue University
FM Ross
Affiliation:
T J Watson Research Center
T Booth
Affiliation:
Technical University of Denmark
T Kjøller Nellemann
Affiliation:
Technical University of Denmark
E Jensen
Affiliation:
Technical University of Denmark
CF Elkjær
Affiliation:
Technical University of Denmark
JL Rasmussen
Affiliation:
Technical University of Denmark
PS Jensen
Affiliation:
Technical University of Denmark
P Bøggild
Affiliation:
Technical University of Denmark
RE Dunin-Borkowski
Affiliation:
Technical University of Denmark

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 322 - 323
Copyright
Copyright © Microscopy Society of America 2010