Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-14T05:35:33.784Z Has data issue: false hasContentIssue false
  • English
  • Français

Three-Dimensional Characterization of Magnetic Tunnel Junctions for Read Head Applications by Atom-Probe Tomography

Published online by Cambridge University Press:  01 August 2010

DK Schreiber ,
Y-S Choi ,
Y Liu ,
DN Seidman  and
AK Petford-Long
DK Schreiber
Affiliation:
Northwestern University
Y-S Choi
Affiliation:
Canon ANELVA Corporation, Japan
Y Liu
Affiliation:
Argonne National Laboratory
DN Seidman
Affiliation:
Northwestern University
AK Petford-Long
Affiliation:
Northwestern University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1912 - 1913
Copyright
Copyright © Microscopy Society of America 2010