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White Beam Differential Phase and Dark Field Imaging at High Resolution

Published online by Cambridge University Press:  10 August 2018

M Endrizzi ,
GK Kallon ,
L Brombal ,
D Dreossi  and
A Olivo
M Endrizzi*
Affiliation:
Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, LondonWC1E 6BT, United Kingdom
GK Kallon
Affiliation:
Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, LondonWC1E 6BT, United Kingdom
L Brombal
Affiliation:
Dipartimento di Fisica, Universita degli Studi di Trieste, Via A. Valerio 2, 34127Trieste, Italy Istituto Nazionale di Fisica Nucleare, Sezione di Trieste, Via A. Valerio, 2, 34127 Trieste, Italy
D Dreossi
Affiliation:
Sincrotrone Trieste SCpA, S.S. 14 km 163.5, 34012Basovizza Trieste, Italy
A Olivo
Affiliation:
Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, LondonWC1E 6BT, United Kingdom
*
*m.endrizzi@ucl.ac.uk

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 156 - 157
Copyright
© Microscopy Society of America 2018 

References

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[9] M. E. was supported by the Royal Academy of Engineering under the RAEng Research Fellowships scheme. We thank Elettra Sincrotrone Trieste for access to SYRMEP beam line (Proposal No. 20170069) that contributed to the results presented here.Google Scholar