The Registration Desk at M&M 2013 is located on the Exhibit (Street) Level outside Hall D in the Indiana Convention Center (See Floor Plan/Map). Pick up your badge and Sunday Social Reception tickets at the Registration desk before 8:00 pm on Sunday. The Sunday Social starts at 6:30 pm in the Convention Center's Sagamore Ballroom.

Major Society Awards for MSA and MAS, along with other awards, will be presented at the Plenary Session immediately following the Keynote Symposium (Monday morning). IMS Awards are presented at the IMS Awards Banquet on Wednesday evening (ticket purchase required). For detailed listings of all awards, criteria, and award winners, please see individual Society information in the Meeting and Program Guide.

This year's social event in the grand Indiana Convention Center Sagamore Ballroom will let you maximize your social time with your friends and colleagues without having to worry about the weather or get on a bus. The Sunday Social Event is a great opportunity to catch up with all your friends and colleagues, make some new ones, and enjoy some wine or local beer and a delicious supper buffet. It's all under one roof!

Get visitor and tourist information on Indianapolis at the M&M 2013 Booth in the main registration area just outside the exhibit hall.

Welcome to the 71st Microscopy & Microanalysis meeting, M&M 2013 in Indianapolis, Indiana! The Microscopy Society of America, the Microanalysis Society, and the International Metallographic Society have excelled again bringing the latest and most innovative applications and instrumental developments from investigators in the biological and physical sciences using microscopy and microanalysis techniques. M&M 2013 features more than 35 symposia covering a broad range of topics, ample educational opportunities in the form of courses and tutorials and pre-meeting events including courses, a congress and a workshop.

The correction of the aberrations of electron lenses is the long story of many seemingly fruitless efforts to improve the resolution of electron microscopes by compensating for aberrations of round electron lenses over a period of 50 years. The problem started in 1936 when Scherzer demonstrated that the chromatic and spherical aberrations of rotationally symmetric electron lenses are unavoidable. Moreover, the coefficients of these aberrations cannot be made sufficiently small. As a result, the resolution limit of standard electron microscopes equals about one hundred times the wavelength of the electrons, whereas modern light microscopes have reached a resolution limit somewhat smaller than the wavelength. In 1947, Scherzer found an ingenious way for enabling aberration correction. He demonstrated in a famous article that it is in theory possible to eliminate chromatic and spherical aberrations by lifting any one of the constraints of his theorem, either by abandoning rotational symmetry or by introducing time-varying fields, or space charges. Moreover, he proposed a multipole corrector compensating for the spherical aberration of the objective lens.

One Continuing Microscopy Education Unit is available for each Physical Sciences Tutorial attended (fee $10/members; $50/non-members).

These full-day courses run from 8:30 AM to 5:00 PM on Sunday, August 4

These in-depth courses will be held Monday-Thursday from 1:00 PM to 3:00 PM.

On behalf of the Microscopy Society of America, the Microanalysis Society, and the International Metallographic Society, we welcome you to the Microscopy & Microanalysis 2013 meeting and its associated Exhibition in Indianapolis, IN. Once again this year, the meeting promises to be the premier opportunity in our field to learn, to connect, and to experience all the latest innovations in the world of microscopy and microanalysis.

Sponsored by the Microscopy Society of America (MSA) and the Microanalysis Society (MAS)