We have implemented a Web-based simulation program for the contrast transfer function and envelope functions in Java and JavaScript. The simulation provides interactive controls of all the parameters in those functions. In addition to the predefined functions, users can easily define new functions that use any of the parameters in the preset functions. The most useful feature of this new simulation program is the convenient, universal accessibility through Web browsers on any computer platform that supports Java, such as Netscape and Internet Explorer.

Imaging techniques often suffer from distortion effects. Former methods of reducing these distortions have been based either on improving the imaging technique (i.e., to avoid distortions) or on the use of reference samples (i.e., to determine the distortion field by imaging of a known structure. We present a novel method of correcting image distortion by evaluating the imaged position changes due to two small sample position shifts. The algorithm allows us to calculate a vector field, which enables us to determine the “undistorted” position of any point of the image. The presented method has very low presuppositions about the sample, requires no reference samples, and is applicable to any type of image distortion. In addition to the presentation of the method's theoretical basis and a description of the computational method, we present corrected secondary ion mass spectroscopy (SIMS) images of a regular structure (a copper grid) as well as a stochastic distribution (sodium impurities) to show the results of empirical data.

The accurate calculation of characteristic peak intensity is essential for interpreting X-ray spectra in electron microprobe analysis. Conventionally, the measured intensity from a standard of known composition is used as a reference to simplify the calculation. However, if no such standard is available, then all factors influencing X-ray generation and X-ray detection efficiency must be included. If the intensity and energy distribution of the background radiation can also be calculated, the investigator can simulate an entire spectrum from an assumed composition, gaining powerful benefits in setting up an experiment and in confirming the results. The study presented here demonstrates a fast method of spectrum simulation, suitable for energydispersive spectroscopy (EDS), and assesses the accuracy using 309 spectra from samples of known composition. These include K, L, and M lines from elements of atomic number 6–92, excited by beam energies in the range of 5–30 keV. The RMS error between 360 measured and calculated peak intensities was found to be 7.1%. Central to the method is the use of the ratio of peak intensity/total background intensity, which allows spectra to be compared from instruments of differing collection efficiency, thereby easing the collection of data over a wide range of conditions.

The scattering cross section is the fundamental measure of the strength of a scattering interaction. All scattering in electron microscopy arises from the Coulomb interaction, and scattering cross sections, whether elastic or inelastic, will therefore all have common features. Simple forms of both elastic and inelastic cross sections are reviewed in the context of high resolution and analytical microscopy. Some recent developments, such as the calculation of Fano resonances in electron energy loss spectra of transition metals and rare earth elements are also discussed.

This is the first report on observation of phase change recorded marks by use of the scanning probe microscope (SPM). The amorphous mark and crystalline blank were clearly observed by surface potential mode (SPoM) that visualized the surface potential difference among phases or materials. SPoM observation has an advantage over conventional transmission electron microscope (TEM) observation in that the sample preparation is much easier, and that amorphous mark and crystalline blank are clearly distinguished. The possibility of a novel readout method of phase change disks, and the possibility of the novel medium with a surface potential detection method are also proposed.

Complementary to our first paper on the origin of threefold contrast on SiC high resolution transmission electron microscopy (HRTEM) images, we now provide an example of threefold contrast produced by a stacking layer sequence which corresponds to one unit cell of the 9R polytype.