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Manufacturer Training of Electron Microscopy and Analysis Techniques

Published online by Cambridge University Press:  14 March 2018

Neil Rowlands
Neil Rowlands*
Affiliation:
Oxford Instruments, Concord, MA
*
neil.rowlands@oxinst.com

Extract

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Training by an instrument manufacturer is provided at various levels, ranging from basic operation requirements of instrumentation to high level courses for specific advanced level applications and integrated solutions.

Initial training usually is in the form of an initial familiarization performed by the installation engineer, and subsequent training is given at training courses at the instrument company laboratory or, in some instances, at the customer site. Manufacturer training can be required on different levels from initiation to basic techniques and operation of the instrumentation to advanced courses for specific applications. Although basic theory is present at the start of a course, the overall aim is to provide practical expertise on an operational level. It is encouraged that customers who are new to the techniques presented may avail themselves of more theoretically orientated courses available at universities and other private institutes.

Type
Research Article
Information
Microscopy Today , Volume 17 , Issue 1 , January 2009 , pp. 18 - 21
Copyright
Copyright © Microscopy Society of America 2009

Footnotes

Note: This article is based on a presentation at the Albuquerque M&M meeting, held in August 2008. The presentation was one of 15 invited and contributed talks in a symposium entitled ‘Teaching of Microscopy and Microanalysis’ chaired by Elaine Schumacher and Charles Lyman. This issue of Microscopy Today includes three other articles derived from talks at that symposium, and future issues are expected to contain additional articles on this topic.

References

Note: This article is based on a presentation at the Albuquerque M&M meeting, held in August 2008. The presentation was one of 15 invited and contributed talks in a symposium entitled ‘Teaching of Microscopy and Microanalysis’ chaired by Elaine Schumacher and Charles Lyman. This issue of Microscopy Today includes three other articles derived from talks at that symposium, and future issues are expected to contain additional articles on this topic.