This paper presents a new method to reveal the relation between the surface deformation and near-field amplitude of a reflector antenna based on complex geometrical optics, which could be used as an efficient way to estimate the antenna surface verified by simulation results. The measurement process based on this method is envisaged to be realized by a single scanning of the near-field amplitude which would overcome many limitations of radio holography and phase retrieval methods such as the frequency and elevation. The largest source of error in the original deformation-amplitude equation (DAE) has been corrected by considering the Gaussian feed as a complex point source. To track the ray trajectory so that the improved DAE could be solved, an iteration method including a golden section search algorithm is designed to make the solution converge. By solving the modified DAE, simulation result shows that a more accurate solution could be obtained, and the antenna surface could be recovered to a root mean square error of under 30 microns.

We propose to build up a facility of sub-picosecond hard X-ray pulses based on Thomson scattering between femtosecond laser pulses and relativistic electrons which is a useful tool for the purpose of material investigation, plasma diagnostics, and shock wave measurement. This article reviews the principles and the development of X-ray sources based on Thomson scattering. Then New Light Source®, the Thomson scattering X-ray facility we will develop is introduced. The characteristics of a Thomson scattering X-ray source are analyzed. A computer model of the Thomson source to be developed is described in order to provide a source of the rays used in a ray tracing method, which has proved to be an essential computer tool for designing and optimizing the optical system of high brightness X-ray facilities. A code for the ray tracing source model is created based on the Monte Carlo approach. It is able to evaluate the properties and performances of the light source under development using this model. According to the simulation results, we discuss the dependence of imaging quality and source properties including spectral distribution, emittance, flux which depends on the laser and electron beam parameters, in order to check if operation performances are as expected. We also estimate the possibility of measuring the energy spectrum of a Thomson scattering source by using a crystal diffraction method. Ray tracing calculations are performed using SHADOW program package, and a new model of Thomson scattering X-ray source which can be processed in that program is established with additional code.

We describe both the classical Lagrangian and the Eulerian methods for first order Hamilton–Jacobi equations of geometric optic type. We then explain the basic structure of the softwareand how new solvers/models can be added to it. A selection of numerical examples are presented.