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Nuclear fuel plates based on a γU-Mo/Al mixture are proposed for research reactors. In this work their thermal behavior in the [425; 550°C] temperature range has been studied mainly by neutron and high energy X-ray diffraction. Even if complementary studies will be necessary, the kinetics of first the growth of the interaction layer between γU-Mo and Al and second of the γU-Mo destabilization have been accurately measured. This basic work should be helpful for defining manufacturing conditions for fuel plates with optimized composition.

Abstract. We propose novel stress metrology technique for measurement of local values stress tensor components in the coated wafers. New metrology is based on fiber-optic low coherence interferometry and can be applied to study stress not only in semicondiuctor wafers but in wide variety applications spanning from semiconductor to construction industry where measurements of plates covered by thin film encountered in flat panel displayes, solar cells, modern windows.

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UMo/Al nuclear fuel plate behavior under thermal treatment (425-550°C)

Fiber-optics Low-coherence Integrated Metrology for In-Situ Non-contact Characterization of Wafer Curvature for Wafers Having Non-uniform Substrate and Thin Film Thickness

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UMo/Al nuclear fuel plate behavior under thermal treatment (425-550°C)

Fiber-optics Low-coherence Integrated Metrology for In-Situ Non-contact Characterization of Wafer Curvature for Wafers Having Non-uniform Substrate and Thin Film Thickness