Thermoluminescence (TL) studies of insulators, including crystals of minerals such as calcite, quartz or zircon, have resulted in the development of a wider range of applications in the fields of radiation dosimetry and archaeological and geological dating. Most conventional TL measurements are made by recording light emission during heating by means of broad-band optical filters and blue-sensitive photomultiplier tubes. Much more information may be gained by monitoring the details of the emission spectrum during thermoluminescence. TL spectra of minerals exhibit changes as a result of crystal purity, radiation dose, dose rate and thermal history. This paper exemplifies the additional information available as a result of spectral studies, and focuses on investigations undertaken by the University of Sussex TL group. Examples include work on calcite, fluorite, zircon and feldspars.

A framework is presented for understanding charging processes in low vacuum scanning electron microscopy. We consider the effects of electric fields generated above and below the specimen surface and their effects on various processes taking place in the system. These processes include the formation of an ionic space charge, field-enhanced electron emission, charge trapping and dissipation, and electron–ion recombination. The physical mechanisms behind each of these processes are discussed, as are the microscope operating conditions under which each process is most effective. Readily observable effects on gas gain curves, secondary electron images, and X-ray spectra are discussed.

Kelvin probe microscopy (KPM) is a specialized atomic force microscopy technique in which long-range Coulomb forces between a conductive atomic force probe and a specimen enable the electrical potential at the surface of a specimen to be characterized with high spatial resolution. KPM has been used to characterize nonconductive materials following their exposure to stationary electron beam irradiation in a scanning electron microscope (SEM). Charged beam irradiation of poorly conducting materials results in the trapping of charge at either preexisting or irradiation-induced defects. The reproducible characteristic surface potentials associated with the trapped charge have been mapped using KPM. Potential profiles are calculated and compared with observed potential profiles giving insight into the charging processes and residual trapped charge distributions.

Chemical–mechanical polishing, or planarization (CMP), is one of several advanced microfabrication processes that provide complementary capabilities for constructing advanced electronic devices. At the current state of the art, CMP demonstrates significant advantages due to its high degree of process flexibility, particularly in the chemical formulation of polishing solutions and slurries. This article explores some possible future applications of CMP using new advanced materials other than silicon, silicon oxide, and silicon nitride. Such materials may include refractory and noble metals, high-κ insulators, and mixed metal oxide perovskites. Although no one can predict future applications with absolute certainty, it seems safe to conclude that CMP will remain a key microfabrication technology for the foreseeable future.

Interferometry, a technique widely used in physics to study radiation fields, has been applied to the investigation of dowsing. Pairs of horizontal linear components, typically some metres in length and a metre or so apart, and parallel in a vertical plane, produce patterns of lines that can be mapped by dowsing rods. The lines are parallel to each other and to the components, and are equally spaced. The spacing of the lines depends on the length, separation and composition of the components. The existence of the patterns shows that the dowsing field is wave radiation. Since there is no detectable difference between patterns produced by pairs of components made of good electrical conductors such as copper, and those produced by good insulators such as uPVC, it is concluded that the radiation field is not electromagnetic. Furthermore, aluminium and tin behave differently from copper and steel. The spacing of the lines has been found to depend on time of year. It increases rapidly in late April and falls rapidly in late November; in between these times it appears to be relatively stable except for an isolated maximum in early March. It shows a high degree of repeatability from year to year.