We describe a new electron-optical configuration for transmission electron microscopy (TEM). In this novel mode, the objective mini-lens is strongly excited so that the back focal plane of the objective lens is imaged onto the plane of the selected-area aperture with a magnification of 3.2. Thus, the selected-area aperture can function as an objective aperture either in place of or in addition to the conventional objective aperture. This new configuration, which has been implemented on a JEOL 4000EX high voltage electron microscope, provides improved resolution and contrast in images of thick biological specimens and also facilitates the use of beam tilt for stereo image acquisition.