The process of electron-beam-induced deposition (EBID) was simulated
with a dynamic Monte Carlo profile simulator, and the growth of carbon,
silver, and tungsten supertips was investigated to study the dependence of
material composition on the spatial resolution of EBID. Because light
atoms have a smaller scattering angle and a longer mean free path, the
carbon supertip has the smallest lateral size and the highest aspect ratio
of a bottom tip compared to silver and tungsten supertips. Thus the best
spatial resolution of EBID can be achieved on materials of low atomic
number. The calculation also indicated a significant contribution of
primary electrons to the growth of a supertip in EBID, which is consistent
with the experimental observations. These results lead to a more
comprehensive understanding of EBID, which is a complex interaction
process between electrons and solids.