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Volume 16 - Supplement S2 - July 2010

Contents

Page 6 of 50

Instrumentation and Techniques Symposia

FIB Science and Applications in Materials and Biology

Abstract

  • Nanofabrication with a High Resolution Helium Ion Beam

  • E van Veldhoven, V Sidorkin, P Chen, P Alkemade, E van der Drift, H Salemink, HW Zandbergen, D Maas
  • Published online by Cambridge University Press:
    01 August 2010, pp. 202-203
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Repeatability of Automated FIB Prepared TEM Samples with Low keV Cleaning

  • M Moriarty, J Blackwood, J Arjavac
  • Published online by Cambridge University Press:
    01 August 2010, pp. 204-205
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Sputtering Behavior of Polymeric Materials During Focused Ion Beam Nanomachining

  • KC Wong, AD Batchelor, CM Balik, DP Griffis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 206-207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • FIB and TEM Studies of Diamond Films Prepared by Laser-Assisted Combustion Flame Deposition in Open Atmosphere

  • M Zhang, T McKindra, M O'Keefe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 208-209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fabrication and Model Simulation of the Ring-shaped Gate Carbon Nanotube Emitter Arrays

  • J Wu, J Jiao
  • Published online by Cambridge University Press:
    01 August 2010, pp. 210-211
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Deformation Mechanisms and Residual Stress Distributions in B4C-TiB2 Directionally Solidified Eutectics

  • R White, EC Dickey
  • Published online by Cambridge University Press:
    01 August 2010, pp. 216-217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Investigation of Baddeleyite Phase Found in Martian Meteorites

  • J Li, T Malis, C Herd
  • Published online by Cambridge University Press:
    01 August 2010, pp. 218-219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Focused Ion Beam Investigations on Cement Based Materials in Aggressive Aqueous Environments

  • T Scherer, M Schwotzer, C Kübel, A Gerdes
  • Published online by Cambridge University Press:
    01 August 2010, pp. 224-225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • FIB-SEM Nanotomography in Materials and Life Science at EPFL

  • M Cantoni, G Knott, C Hébert
  • Published online by Cambridge University Press:
    01 August 2010, pp. 226-227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Site-Specific Plan-View Sample Preparation in the FIB

  • S McKernan, Y Zhu, J Xie
  • Published online by Cambridge University Press:
    01 August 2010, pp. 228-229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

  • J Gazda, J Duarte, F Daby-Merrill
  • Published online by Cambridge University Press:
    01 August 2010, pp. 230-231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • FIB Cross-sections of Cells on a Patch Clamp Chip

  • J Fraser, D Salim, C Py, D Martinez, T Comas, R Monette
  • Published online by Cambridge University Press:
    01 August 2010, pp. 232-233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Characterization of Pseudomonas Fluorescens Bacteria on Polyurethane Using DB-FIB, SEM and STEM

  • A Blankemeier, DE Huber, HL Fraser, W Goodson, REA Williams, HO Colijn
  • Published online by Cambridge University Press:
    01 August 2010, pp. 234-235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Lithographically Defined Epitaxy via Focused Ion Beam Induced Lattice Damage

  • BD Myers, B Stevens, S Barnett, VP Dravid
  • Published online by Cambridge University Press:
    01 August 2010, pp. 236-237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • FIB Clean Up of ToF-SIMS Craters for Microstructural Characterization

  • VS Smentkowski, D Ellis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 238-239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Computational Aspects of Data Visualization and Quantitative Microscopy and Microanalysis

Abstract

  • Computational Aspects in Quantitative EELS

  • J Verbeeck, S Van Aert, L Zhang, T Haiyan, P Schattshneider, A Rosenauer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 240-241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 6 of 50