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Volume 26 - Supplement S2 - August 2020

Contents

Page 21 of 57

Approaching Operando Imaging of Functional Materials

  • Charge Carriers in Dynamic Ferroelectric Domain Walls

  • Kalani Moore, Lynette Keeney, Clive Downing, Michele Conroy, Ursel Bangert
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1140-1141
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  • Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics

  • Debaditya Chatterjee, Paul Voyles
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1142-1143
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  • Microreactor for Clean and Controlled In-situ SEM Imaging of CVD Processes

  • Libor Novak, Petr Wandrol, Ernst Jan R. Vesseur
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1144-1145
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Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

  • Probing the Surface Photovoltage Effect by Imaging Photo-assisted Secondary Electron Emission

  • Bolin Liao, Yu Li, Usama Choudhry
  • Published online by Cambridge University Press:
    30 July 2020, p. 1156
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

  • cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations

  • Jian-Min Zuo, Xiurong Zhu, Elaine Ang, Rahul Shah
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1166-1167
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  • Laboratory Scale Photogrammetry: Micro- and Macroscopic 3D Surface Imaging

  • Daria Monaenkova, Diana Deese, Chad Schuette, Matthew Thorseth
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1170-1171
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  • Data Processing Using Python in DigitalMicrograph

  • Benjamin Miller, Stephen Mick
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1172-1174
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  • Quantitative Image Format for Electron Microscopy

  • Grigore Moldovan, Michael Zabel
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1176-1178
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  • Experimental data, simulation, data analysis and visualisation require image file formats that are open source and able to contain and manage quantitative data. Quantification techniques bring the new challenge of managing image calibration parameters and formulas in an open and efficient format, compatible with routine microscopy workflows. A practical approach to quantitative image format is presented and discussed here, relying on open and extensible file formats - Tagged Image File (TIF) and Extensible Metadata Platform (XMP).

  • Offline Secondary Electron Counting and Conditional Re-illumination in SEM

  • Akshay Agarwal, John Simonaitis, Vivek Goyal, Karl Berggren
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1182-1184
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  • A New Energy-filtering EBSD/TKD Direct Detector

  • Benjamin Bammes, Robert Bilhorn
  • Published online by Cambridge University Press:
    30 July 2020, pp. 1186-1187
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Page 21 of 57