Proceedings of Microscopy & Microanalysis 2014
Front Cover and Front matter
Welcome from the Society Presidents
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Welcome from the Society Presidents
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- 27 August 2014, p. xciii
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Welcome From the Program Committee
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Welcome to this Microscopy and Microanalysis meeting, M & M 2014 in Hartford, Connecticut!
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- 27 August 2014, pp. xciv-xcvi
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Plenary Special Lectures
Abstract
How Cutting-Edge Atomic Resolution Microscopy Can Help to Solve Some of the World's Energy Problems
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- 27 August 2014, pp. xcvii-c
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Microscopy Society of America
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Microscopy Society of America
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- 27 August 2014, pp. ci-cvii
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Microanalysis Society
Abstract
MAS Awards
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- 27 August 2014, pp. cviii-cxii
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International Metallographic Society
Abstract
International Metallographic Society
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- 27 August 2014, pp. cxiii-cxvii
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Microscopical Society of Canada
Abstract
Microscopical Society of Canada / Société de Microscopie du Canada 2014
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- 27 August 2014, pp. cxviii-cxx
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International Union of Microbeam Analysis Societies (IUMAS) 2014
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International Union of Microbeam Analysis Societies (IUMAS) 2014
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- 27 August 2014, pp. cxxi-cxxiii
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Advances in Instrumentation Symposia
Oliver Wells Memorial Symposium on the Scanning Electron Microscope
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Oliver Wells (1931-2013) A Brief Memorial
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- 27 August 2014, pp. 2-3
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Oliver C. Wells' Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution
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- 27 August 2014, pp. 4-5
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Model-Based Library for Critical Dimension Metrology by CD-SEM
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- 27 August 2014, pp. 6-7
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High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects
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- 27 August 2014, pp. 8-9
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Oliver Wells: My Recollections
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- 27 August 2014, pp. 10-11
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Improved SEM Image Resolution Through the Use of Image Restoration Techniques
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- 27 August 2014, pp. 12-13
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Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM
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- 27 August 2014, pp. 14-15
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High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals
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- 27 August 2014, pp. 16-17
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Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates
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- 27 August 2014, pp. 18-19
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Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM - Successes and Challenges
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- 27 August 2014, pp. 20-21
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Discussion of Electron Induced Atomic Number Contrast
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- 27 August 2014, pp. 22-23
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SEM Through Dielectric Membranes: Secondary Electron Contrast Reversal
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- 27 August 2014, pp. 24-25
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