Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Analysis of the Quality of Nanoscale TMR Layer Stacks

In-Situ Detection Of Stress Induced Voids In Thin Metallizations

TEM Microstructure Investigation of Si/Ge Superlattice Exhibiting 1.55 μm Photoluminescence at Room Temperature

Interfaces between MgA12O4 Spinel Layers and Oxide Substrates

Atomic structure of basal-plane inversion boundaries in SnO2-doped ZnO

Nickel Disilicide/Silicon(001) Interface Structure revealed by HAADF in an Aberration corrected dedicated STEM

Interfaces of Xe Clusters with Al --- Displacement of Atomic Positions of Crystalline Xe and Ordering in a Fluid Xe Confined by Flat Surfaces

Surface Structure and Nature of the Thin Film Coatings on the Surface of Porous Silicon

How General is a Special Grain Boundary?

Shapes and Interfaces of Voids in III-V Compound Semiconductors

New Methods to Modify Epitaxy at Cu-Alumina Interfaces

Interface and Surface Phenomena of Transition Metal Dichalcogenide Crystals: Ultrathin Layer Epitaxy and Self-assembling of Nanostructures

Exsolution investigated in Magnetite-Hercynite solid solution with energy filtered TEM

Scanning Probe Microscopy in Researches of Micro- and Nanostructure in Noncristalline Geomaterials

The Characteristic of the Superstructural Organizations of Natural Solid Bitumens with AFM

Synthetic Forsterite (Mg2SiO4) Bicrystals with Symmetric Tilt Grain Boundaries

The Analysis of Insulating Materials in the Variable Pressure Scanning Electron Microscope using very short Beam Gas Path Length Strategies

Single Crystal Growth and Characterization of Structure-Modulated Melilites with Different Composition

High-resolution and energy-filtered TEM of the interface between hematite and ilmenite exsolution lamellae: Relevance to the origin of lamellar magnetism

Microstructural differences between the catalyst and the standard V5+ phases of VPO

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers