Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Plenary

Z01 M&M 2015 Plenary

Abstract

New Molecular Tools for Light and Electron Microscopy

Some Unexpected Difficulties in Microscope Operation in Microgravity

Sorby Lecture

X99 Sorby Lecture

Abstract

Microstructural Developments Leading to New Advanced High Strength Sheet Steels: A Historical Assessment of Critical Metallographic Observations

Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

The Biodynamic Microscope: Doppler Imaging inside Living 3D Biological Tissues

Field-Portable Nano-Imaging: A New Tool for On-Demand Microscopy

Automated, Programmable Processing of Specimens and Grids with the mPrep™ ASP-1000

Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics

Mastering the Multi-scale Challenge: A Modern Correlation Environment

RISE Microscopy: Correlative Raman and SEM Imaging

A11 Electron Vortex Beams and Higher-Order Beam Modes

Abstract

The Surprising Dynamics of Electron Vortex Beams

Unveiling the OAM and Acceleration of Electron Beams

An Orbital Angular Momentum Spectrometer for Electrons

Structured Electron Beam Illumination: A New Control Over the Electron Probe Weird Probes and New Experiments

A12 Low Voltage Electron Microscopy

Abstract

Direct Observation of Nano-porous Materials Using Low Voltage High Resolution SEM

Examination of Graphene in a Scanning Low Energy Electron Microscope

Conductivity Contrast in SEM Images of Hydrogenated Graphene Grown on SiC

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques

20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

Bridging the Gap between the Modeling Approach and the Experiment in Atom Probe Tomography

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic Nanodiamonds

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Plenary

Z01 M&M 2015 Plenary

Abstract

Sorby Lecture

X99 Sorby Lecture

Abstract

Analytical and Instrumentation Science Symposia

A01 Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

A11 Electron Vortex Beams and Higher-Order Beam Modes

Abstract

A12 Low Voltage Electron Microscopy

Abstract

A13 Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract