Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms

Abstract

My Sixty Years Spent with Professor Hatsujiro Hashimoto

Atomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs

Defect Evolution in GaAs-based Low-mismatch Heterostructures

Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices

Contributions to High Resolution and In Situ Electron Microscopy

A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys

Whys and Wherefores of Open Aperture ESTEM for in-situ Catalyst Reaction Studies

In Memory of the Late Professor Hatsujiro Hashimoto: Toward the Realization of His Dream

Improving the STEM Spatial Resolution Limit

Anchoring and Localizing Single Metal Atoms for Better Catalysis

Imaging of Single Vacancies and Dopant Complexes in Aluminum Nitride

Atomic Resolution Imaging and Quantitative Elemental Mapping of the Misfit Dislocation Core Phase in Multicomponent Oxides

Differential Potential Distribution Observation in Transmission Electron Microscope with Conventional Thermal Electron Gun

Professor Hatsujiro Hashimoto: My Great Mentor as a Pioneer of Electron Microscopy

CBED Investigations of Boron Monoarsenide Crystals

DBI Phase Measurements of Amorphous Materials for Thickness and Structure Factor Determination

HREM and Analytical TEM of the Rapidly Solidified Microstructure Evolved at the Extremes of the Coupled Crystal Growth Regime in Hypo-Eutectic Al-Cu Alloys

Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy

TEM/SAED Study of Mn2CrGaAl and CoFeCrGe Heusler Alloys

SIS-HOLZ Strain Measurements Through the Thickness of a SI Crystal

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms

Abstract