Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences

Sub-nm Resolution, Sub-pm Precision Structure Mapping Robust to Thickness and Tilt Variations by Cepstral Analysis of Scanning Nanodiffraction 4D-STEM

Crystallographic symmetry classifications of noisy 2D periodic images in the presence of pseudo-symmetries of the Fedorov type

Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM

Advances in the Structure Analysis from Electron Diffraction Data: Determination of Absolute Structure of Chiral Molecules

Multidimensional Electron Diffraction-Microscopy of Cabotegravir Nanocrystals

4D-STEM Pair Distribution Function Mapping of the Morphology and Structure of Amorphous Organic Materials

In Situ Electron Diffraction using Liquid-Electrochemical TEM for Monitoring Structural Transformation in Single Crystals Of Cathode Materials for Li-Ion Batteries

Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials

Understanding Deformation and Failure Mechanisms via Multimodal and Multiscale Electron Diffraction Analysis

In-Situ Bending and Structural Characterization of Penta-Twinned Silver Nanowires

Gazing at Crystal Balls – Electron Backscatter Diffraction Indexing and Cross Correlation on a Sphere

Diffraction Mapping with a Pixelated Detector to Quantify Crystal Orientation in 3D Structures Made from 2D Materials

Improved 4D-STEM Strain Mapping Precision Using Patterned Probes

High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM

Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach

When Ion or Electron Channeling Meets Crystal Orientation Mapping

The Role of Cluster Analysis in Automated Serial Electron Crystallography

Two beam toy model for dislocation contrast in ECCI

Nano-scale Crystallographic Aspects of Discontinuous Precipitation and Coarsening Reactions in Cu-10% Co Alloy

Determination of Crystallinity in Li1−xMgxMn2O4 Nanocrystals Based on Diffraction Patterns Correlation Analysis and Strain Mapping

Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences