Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Login Alert

Log in

×

×

Back to search results

Home
Journals
Microscopy and Microanalysis
Volume 16

English
Français

Microscopy and Microanalysis

Add bookmark

Share

Search within full text

Other actions

Journal Home

Journal home
Micrographia
Sample content
Collections
FirstView articles
Latest issue
All issues
Most cited

Refine listing

Refine listing

Access:

Only show content I have access to (1000)

Publication date:

Over 3 years (1121)

Topic: Show more

Instrumentation and Techniques Symposia (478)

Physical Sciences Symposia (298)

Biological Sciences Symposia (89)

Physical Sciences (58)

Biological Applications (25)

Biological Sciences (25)

Instrumentation and Techniques (16)

Other Educational Opportunities (9)

Materials Applications (8)

Technologists’ Forum (7)

Biological Science Tutorials (2)

Physical Sciences Tutorials (2)

Classifications

Actions for selected content:

Select all | Deselect all

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Search Title: required Please provide a title, maximum of 40 characters.

×

< Back to all issues

Volume 16 - July 2010

Contents

Page 52 of 57

First
« Prev
49
50
51
52
53
54
55
Next »
Last

Physical Sciences Symposia

Probing the Properties of Nanomaterials with Microscopy

Abstract

DNA Sequencing with TEM
DC Bell, W Thomas, K Murtagh, WR Glover
Published online by Cambridge University Press:

01 August 2010, pp. 1768-1769
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The SEM/FIB Workbench: Nanorobotics System Inside of Scanning Electron or Focused Ion Beam Microscopes
V Klocke, B Plitzko
Published online by Cambridge University Press:

01 August 2010, pp. 1770-1771
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural Studies of Mono-Atomic Layer-Deposited (FePt)1-xCux Thin Films and FePt Thin Films with Pt Top-Layer Deposition
XZ Li, YS Yu, T George, DJ Sellmyer
Published online by Cambridge University Press:

01 August 2010, pp. 1772-1773
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural Characterization of Gold Icosahedron Crystals
SV Prikhodko, M Pozuelo, L Chen, SD Sitzman, R Richards, S Kodambaka
Published online by Cambridge University Press:

01 August 2010, pp. 1774-1775
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Self-Assembled Lanthanide Phosphate/Magnetite Nanocomposites
J Fang, M Saunders, Y Guo, G Lu, CL Raston, KS Iyer
Published online by Cambridge University Press:

01 August 2010, pp. 1776-1777
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Probing the Mechanical Properties of Metal Wires at Small Scale by Microscopy
T Scherer, S Zhong, D Wang
Published online by Cambridge University Press:

01 August 2010, pp. 1778-1779
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Swift Heavy Ion Irradiation of Nickel Nanoparticles
DJ Sprouster, R Giulian, DJ Llewellyn, P Kluth, LL Araujo, JD Fitzgerald, MC Ridgway
Published online by Cambridge University Press:

01 August 2010, pp. 1780-1781
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Absolute Strain at the Nanoscale from HREM Images
CL Johnson, E Snoeck, MJ Hÿtch
Published online by Cambridge University Press:

01 August 2010, pp. 1782-1783
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Piezoelectric Goniometer Inside a TEM Goniometer
W Guan, A Lockwood, BJ Inkson, G Möbus
Published online by Cambridge University Press:

01 August 2010, pp. 1784-1785
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Strain Relaxation in Planar InAs Epitaxial Layers Studied by High-Resolution Transmission Electron Microscopy
K Mahalingam, KG Eyink, M Twyman, J Shoaf, L Grazulis
Published online by Cambridge University Press:

01 August 2010, pp. 1786-1787
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Crystalline Structure and ELNES of Branched Al2O3 Nanowires
M Eastman, R Schaller, A Besser, J Jiao
Published online by Cambridge University Press:

01 August 2010, pp. 1788-1789
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

TEM and EBSD Study of Fe3O4 Particle Chains Grown and Assembled in External Magnetic Field
J-G Zheng, Y Zhang, Y Zhai, HW Yang
Published online by Cambridge University Press:

01 August 2010, pp. 1790-1791
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Methods for TEM Analysis of NIST’s SWCNT SRM
RH Geiss, E Mansfield, JA Fagan
Published online by Cambridge University Press:

01 August 2010, pp. 1792-1793
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron Irradiation Damage of MgO Nanocube
H Zhang, M Malac, RF Egerton
Published online by Cambridge University Press:

01 August 2010, pp. 1794-1795
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Conjugated Polymer Nanoparticles for Fluorescent Labeling of Live Cells and Delivery of Biological Molecules into Plant Cells
AT Silva, JH Moon, J Verchot-Lubicz
Published online by Cambridge University Press:

01 August 2010, pp. 1796-1797
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Importance of High-Resolution Scanning Transmission Electron Microscopy For Fine-Scale Dislocation Analysis
PJ Phillips, L Kovarik, RR Unocic, D Wei, D Mourer, MJ Mills
Published online by Cambridge University Press:

01 August 2010, pp. 1798-1799
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope
K Roelofs, S Xu, G Poirier, N Yao
Published online by Cambridge University Press:

01 August 2010, pp. 1800-1801
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Scale Effects on the Melting Behavior of Silver Nanoparticles
MA Asoro, D Kovar, J Damiano, PJ Ferreira
Published online by Cambridge University Press:

01 August 2010, pp. 1802-1803
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Metallic Core-Shell Structure of Electro-Catalysts
D Su, L Wu, H Inada, JX Wang, W Zhou, K Sasaki, K Gong, RR Adzic, Y Zhu
Published online by Cambridge University Press:

01 August 2010, pp. 1804-1805
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction
A Kohn, D Kirk, KB Borisenko, C Lang, J Schmalhorst, G Reiss, DJH Cockayne
Published online by Cambridge University Press:

01 August 2010, pp. 1806-1807
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 52 of 57

First
« Prev
49
50
51
52
53
54
55
Next »
Last

Our Site

Accessibility
Contact & Help
Legal Notices

Our Platforms

Cambridge Core
Cambridge Open Engage
Cambridge Higher Education

Our Products

Journals
Books
Elements
Textbooks
Courseware

Join us online

Location

Please choose a valid location.

Rights & Permissions
Copyright
Privacy Notice
Terms of Use
Cookies Policy

Cambridge University Press 2024

×