Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

3D Display and Analysis of Strain Fields at Heterointerfaces

Quantitative Image Analysis

Calibration of Image Analysis Systems for Statistically Demanding QM Applications

Characterization of Zeolite-supported Pt Catalysts by Image Analysis

Image Analysis Effects using Image Compression

Automatic Classification of the Shape of Graphite Particles in Cast Iron

Morphological and Morphometrical Characteristics of Particulate Solids To Recycle Resulting from Electric Cables Crio-comminution.

Quantitative Characterization of Particle Rotations During Plastic Deformation of Two Wrought Aluminum Alloys

Information Transfer Capability and Signal Processing Performance of Modern Scanning Electron Microscopes

Image Processing and Analysis in HRTEM

RIMAPS Characterization of Etch Pits on Deformed Aluminum Surfaces

Which atoms are where? Which fields are around?

Problems Concerning Application of Electron-Holography Observation of P-N Junctions from the Viewpoint of the Semiconductor Industry

Observing a p-n Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography and Focused-Ion-Beam Milling

Is It Feasible To Routinely Check The Dopant Profiling Via Off-Axis Electron Holography For An IC Failure Analysis Laboratory?

Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography

Electron Holography and Micromagnetic Simulations for TEM Magnetization Mapping

Lorentz Phase Imaging and In-situ Lorentz Microscopy of Patterned Co-Arrays.

Electron Holographic and Lorentz Microscopic Images of Variously Shaped Magnetic Specimens

Measurement of Charge at Grain-boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography

Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract