Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Planetary-materials Characterization in the Era of Mission Returned Sample Analysis

Evaluation of Space Weathering and Surface Exposure Timescales for Lunar Soils in Apollo 17 Core Sample 73002 through Electron Microscopy

Electron Microscopy and Analysis of Martian Meteorite ALH84001 with MochiiISS-NL on the International Space Station

On Demand - Planetary-materials Characterization in the Era of Mission Returned Sample Analysis

Combining SEM-EDS and Micro-XRF-EDS Analysis: In-situ Search for Trace Mineral Phases in Meteorites

Magnetic Domain Structure of Magnetite Particles in the Return Sample from Asteroid Ryugu by the Hayabusa2 Mission

Mineralogy and space weathering found in the fine-grained samples returned from the C-type asteroid Ryugu

The Importance of Correlative Microscopy for Planetary Sample Return Missions

The Winchcombe CM2 Meteorite Fall: Curation and Preliminary Analysis

Memorial Symposium: John C.H. Spence

Spreading Happiness and Scientific Enlightenment: 40 Years as a Friend and Colleague of John Spence

From John Spence's Postdoc Time in Oxford to my Research on GaN and Graphene

The Beauty and Clarity of a Well Designed Experiment

John C.H. Spence – friend, teacher, mentor, scientific pioneer and visionary

Elemental Quantification and Experimental Measurement of Mean Free Path Using EELS and CBED at 30 keV

Seeing Electrons in Chemical Bonds – John Spence's Vision for Electron Microdiffraction and How to Realize it for Molecular Crystals

Bouncing Around Between Real and Reciprocal Space with Electrons and X-rays, an Adventure with John Spence.

John C. H. Spence's Career-Long Impact on me as his Early Graduate Student

Scanning Precession Electron Diffraction and What We Get Out of Such Data in Studies of Aluminium Alloys

Adventures in 4D-STEM - Underpinned by the Legacy of JCH Spence

John C. H. Spence and the Age of X-Ray Lasers

Coherence and Inelastic Scattering in Electron Microscopy

The Design and Operation of a New Relativistic Ultrafast Electron Diffraction and Imaging (RUEDI) National Facility in the UK

Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Planetary-materials Characterization in the Era of Mission Returned Sample Analysis

On Demand - Planetary-materials Characterization in the Era of Mission Returned Sample Analysis

Memorial Symposium: John C.H. Spence