International Reports
Calendar of Meetings
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- 29 February 2012, pp. 163-164
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Short Courses & Workshops
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- Published online by Cambridge University Press:
- 29 February 2012, pp. 164-165
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DENVER X-RAY CONFERENCE
Denver X-ray conference
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- 20 May 2016, pp. 166-171
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S214 Materials State Awareness: Dealing with Uncertainty in Design and Service
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- 20 May 2016, p. 172
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S191 Dental Stress, Mechanical Not Psychological, Even Some Residual Stress
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- 20 May 2016, p. 172
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S212 Residual Stresses in U.S. Nuclear Power Systems
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- 20 May 2016, p. 172
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S190 More Miles for Tired Iron: The Application of Engineered Compressive Residual Stresses in Aging Aircraft
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- 20 May 2016, p. 172
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D-19 High-Performance Silicon Strip Detector for In-House XRD System
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- 20 May 2016, p. 172
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D-6 X-ray Diffractometry with a Microfocus Source
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- 20 May 2016, p. 172
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D-34 Wavelet Analysis of X-ray Diffraction Signal From Measurements of Stress and Austenite
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- 20 May 2016, p. 172
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D-51 New High-Performance Device for Parallel-Beam X-ray Diffractometer Scan
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- 20 May 2016, p. 172
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D-25 An Innovative EDXRD Probe
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- 20 May 2016, p. 172
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D-66 Detectors for Demanding X-ray Diffraction Experiments
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- 20 May 2016, p. 172
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F-71 New S2 PICOFOX Benchtop TXRF
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- 20 May 2016, p. 172
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F-53 New Development for the Automation of Borate Fusion Sample Preparation for XRF
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- 20 May 2016, p. 173
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F-81 High Volume Scrap Material Sorting Using XRF
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- 20 May 2016, p. 173
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F-76 Turn-Key Solutions with Integrated Flexibility From Package to Real Solution
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- 20 May 2016, p. 173
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F-7 Development of a Novel Multi-Element Silicon Drift Detector Array
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- 20 May 2016, p. 173
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F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window
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- 20 May 2016, p. 173
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F-66 Mg-Based Multilayer XRF Analyzers with Two- and Three-Layers Structure Design
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- 20 May 2016, p. 173
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