Order, in the sense of arrangement, structure, coordination, or sequence, arises in many fields and at all scales. It is found with varying degrees of perfection in many if not most subjects for microscopy, can take many forms, and can be challenging to recognize or to measure. A variety of examples are provided that are intended to make the reader more aware of the possibilities.

Single-molecule localization microscopy (SMLM) is a family of super-resolution microscopy techniques based on localizing clusters of detected photons that are emitted by single molecules. The localization procedure is based on careful statistical analysis of long image sequences to derive the nanometer positions of the molecules. By introducing additional optics, such as cylindrical lenses in the optical system, SMLM techniques have been extended to 3D super-resolution imaging. This adds a calibration step, thereby further complicating the data analysis. Here we present Huygens Localizer, a well-supported user-friendly package that carries out these tasks quickly by offloading carefully designed 2D and 3D analysis and visualization procedures to massively parallel graphical processors (GPUs).

A low-cost infrared microscope is evaluated in both transmission and attenuated total internal reflection (ATR) sampling modes. Transmission spectra of 60 to 250 micrometer samples exhibited an excellent signal-to-noise ratio. Signal-to-noise in transmission mode also correlated well with theoretical predictions. The quantitative capability of the microscope was demonstrated by measuring the colorant concentration of red, yellow, and blue polypropylene fibers. These latter measurements were conducted using the ATR sampling mode of the microscope. Colorant concentrations could be measured to 1% by weight, and calibration curves with excellent R2 values were obtained over the dye concentration range of 1 to 10% by weight colorant.

Two standardless quantitative methods for evaluating EDS X-ray spectra were investigated in regards their basic metrics. Both methods have similar total errors, but the error contributions are from different sources. In the P/B-based method, error is more related to counting statistics and therefore can benefit from high count rates achievable with modern silicon drift detectors. To reduce systematic uncertainties in the net-count-based standardless approach, measured values need to be supported by data in a previously measured database. Using the P/B-based method, it is now possible to achieve standardless EDS quantification within ±10% relative deviation from true composition for 95% of results.

Electron diffraction is an essential tool for materials scientists to have in their characterization toolboxes. When using the transmission electron microscope (TEM) to perform diffraction experiments, setting up the microscope for both calibration standards and unknown materials in a consistent method will ensure that dependable results are obtained. Care must also be exercised to protect digital cameras from intense transmitted and diffracted beams to avoid damage. A procedure is presented that will allow a microscopist to reproducibly configure the microscope and sample to acquire selected area electron diffraction patterns so that these issues are addressed.

The Online Electron Microscopy Platform makes electron microscopy education accessible by combining simulation-based practice with a range of educational content. Students learn how to operate electron microscopes by using virtual microscopes that precisely simulate the functions of real microscopes. Built as a web application, the platform can be used by an unlimited number of people and at any time. This platform reduces the time needed for training users to operate a real microscope. By preparing students in STEM disciplines to use electron microscopes, the system helps them acquire the skills they need to succeed in the modern workforce.