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Evaluation of brightness of an intense pulsed ion beam by Thomson spectrometer

Published online by Cambridge University Press:  09 March 2009

K. Masugata ,
H. Okuda ,
K. Yatsui  and
T. Tazima
K. Masugata
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
H. Okuda
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
K. Yatsui
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
T. Tazima
Affiliation:
National Institute for Fusion Science, Nagoya 464, Japan
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Abstract

A method is proposed to evaluate the power brightness of an intense pulsed ion beam by using a Thomson parabola spectrometer (TPS). In the method, the time-dependent power brightness of each ion species can be determined independently from the density profile of ion tracks. The method is successfully utilized to evaluate the power brightness of ion beams produced in point pinch diode. The brightness of highly ionized carbons of 660 keV and oxygens of 880 keV, and singly ionized molecular ions of 400 keV, are evaluated independently. The total brightness is evaluated to be 3.2 GW/cm2/sr for highly ionized ions, and 1.9 GW/cm2/sr for molecular ions.

Information

Type
Regular Papers
Information
Laser and Particle Beams , Volume 15 , Issue 2 , June 1997 , pp. 325 - 338
Copyright
Copyright © Cambridge University Press 1997

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References

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