Hostname: page-component-7dd5485656-bvgqh Total loading time: 0 Render date: 2025-10-30T23:12:38.479Z Has data issue: false hasContentIssue false
  • English
  • Français

Test of a High-gradient Low-emittance Electron Gun

Published online by Cambridge University Press:  09 March 2009

F. Villa ,
F. Villa  and
A. Luccio
F. Villa
Affiliation:
Stanford Linear Accelerator Center, Stanford California 94309, USA
F. Villa
Affiliation:
Frantel Inc., 13847 Skyline Bld., Los Gatos, California 95030, USA
A. Luccio
Affiliation:
Brookhaven National Laboratory, Upton, New York 11973, USA
Get access Rights & Permissions [Opens in a new window]

Abstract

A maximum electric field E = 2.65 GV/m with an accelerated electron current of 1 KA has been obtained, for pulse lengths of 130 ps, in an electron gun based on Pulse Power Technology. This is the highest accelerating field ever achieved in the presence of such a large current. Measurements of beam emittance and energy from 0.4 to 2.65 MeV show that the scaling of the invariant emittance with electric field and with beam current is consistent with theoretical predictions. A few applications of high-gradient acceleration are discussed.

Information

Type
Research Article
Information
Laser and Particle Beams , Volume 15 , Issue 3 , September 1997 , pp. 427 - 447
Copyright
Copyright © Cambridge University Press 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

Aronson, S. 1986 AIP Conf. Proc. 156, 283.CrossRefGoogle Scholar
Baglin, V. et al. 1993 In Proc. IEEE Part. Ace. Conf., p. 2720.Google Scholar
Bamber, C. 1991 Ph.D. Thesis, University of Rochester, UR-1237, Rochester, New York.Google Scholar
Bamber, C. 1992 A.I.P. Conf. Proc. 279, 802.CrossRefGoogle Scholar
Bamber, C. 1993a A.I.P. Conf. Proc. 193, 1.Google Scholar
Bamber, C. 1993b Nucl. lnst. Meth. A327, 227.CrossRefGoogle Scholar
Ben-ZVI, I. 1993 IEEE, Part. Ace. Conf, p. 2962.Google Scholar
Carroll, F.C. 1994 J. X-Ray Science and Tech. 4, 323.Google Scholar
Cassell, R.E., & Villa, F. 1989 SLAC Pub. 4858.Google Scholar
Conde, M.E. et al. 1993 In IEEE Part. Ace. Conf, p. 2720.Google Scholar
Dickey, F.R. Jr 1952 J. App. Phys. 23, 1336.CrossRefGoogle Scholar
Donaldson, W. et al. 1987 Sixth IEEE Pulsed Power Conf, p. 77.Google Scholar
Fischer, J. & Srinivasan-Rao, T. 1994 In Proc. “Sources '94,” Workshop on e+ e− Sources and Pre-Accelerators for Linear Colliders (Schwerin, Germany) p. 287.Google Scholar
Fischer, J. et al. 1990 In Workshop on Short Pulse High Current Cathodes, LeDuff, J., ed. (Editions Frontieres, Gif-sur-Yvette).Google Scholar
Fletcher, R.C. 1949 Phys. Rev. 76(10).CrossRefGoogle Scholar
Hartman, S.C. 1993a In IEEE Part. Ace. Conf, p. 561.Google Scholar
Hartman, S.C. 1993b Ph.D. Thesis. University of California, Los Angeles.Google Scholar
Jüttner, B. 1970 Beitrage für Plasmaphysik 100, 383.CrossRefGoogle Scholar
Kadish, A. et al. 1984 Los Alamos LA-10207-MS, UC-34.Google Scholar
Kekez, M.M. 1991 Rev. Sci. Instr. 62, 2923.CrossRefGoogle Scholar
Kekez, M.M. & Liu, J. 1994 J. Meas. Sci. Technol. 5, 1389.CrossRefGoogle Scholar
Kim, K-J. 1989 Nucl. lnst. Meth. A275, 201.CrossRefGoogle Scholar
Mayhall, D.J. et al. 1987 In IEEE Int. Conf. on Plasma Science (Seattle, WA), p. 91.Google Scholar
Mayhall, D.J. et al. 1990 In Proc. SPIE 1378, 101.CrossRefGoogle Scholar
Mayhall, D.J. et al. 1991 In IEEE Int. Conf. on Plasma Science (Williamsburg, VA), p. 210.Google Scholar
Mayhall, D.J. et al. 1992 Proc. SPIE 1631, 299.CrossRefGoogle Scholar
Mazaheri, G. 1991 In IEEE Nuclear Science Symposium and Medical Imaging Conference (Santa Fe, NM), 312.Google Scholar
Mesyats, G.A. & Korolev, Y.D. 1966 Sov. Phys. Usp. 29, 57.CrossRefGoogle Scholar
Mesyats, G.A. et al. 1972 Sov. Phys. Usp. 15, 282.CrossRefGoogle Scholar
Mesyats, G.A. & Korolev, Y.D. 1989 Pulsed Electrical Discharge in Vacuum (Springer Verlag, Berlin-Heidelberg).CrossRefGoogle Scholar
Miller, H.C. 1988 General Electric Aerospace GE PP-TIS-366E UC13.Google Scholar
O'Shea, P.G. et al. 1992 AIP Conf. Proc. 193, 743.CrossRefGoogle Scholar
Pincosy, P.A. et al. 1992 Proc. of the SPIE 1631,277.CrossRefGoogle Scholar
Reiser, M. 1994 Theory and Design of Charged Particle Beams (John Wiley, New York).CrossRefGoogle Scholar
Schlueter, R. 1994 Stanford University August 21–26, Report LBL-36055/LSBL-214/UC-410.Google Scholar
Shkuratov, S.I. 1995 IEEE Trans, on Dielectrics and Electrical Insulation 2, 251.CrossRefGoogle Scholar
Shoessow, P. (ed.) 1994 AIP Conf. Proc. 335, 254.Google Scholar
Slivkov, I.N. 1986 Protsessy pri vysocom napriazhenii v vakuume (Energoatomizdat, Moskva) (in Russian).Google Scholar
Tcang, T. et al. 1992 Nucl. Inst. Meth. A318, 270.Google Scholar
Villa, F. 1989 SLAC Pub. 4894.Google Scholar
Villa, F. 1990 U.S. Patent #4893089.Google Scholar
Villa, F. 1993 Unpublished data.Google Scholar
Villa, F. et al. 1996 Mycrosystem Tech. 2, 79.CrossRefGoogle Scholar
Wang, X.J. et al. 1992 J. Appl. Phys. 72, 888.CrossRefGoogle Scholar
Willis, W. 1985a AIP Conf. Proc. 130, 421.CrossRefGoogle Scholar