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Detector Background And Sensitivity Of Semiconductor X-Ray Fluorescence Spectrometers

Published online by Cambridge University Press:  06 March 2019

F. S. Goulding ,
J. M. Jaklevic ,
B. V. Jarrett  and
D. A. Landis
F. S. Goulding
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, California 94720
J. M. Jaklevic
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, California 94720
B. V. Jarrett
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, California 94720
D. A. Landis
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, California 94720
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Abstract

Degraded detector pulses are shown to contribute most of the background in spectra produced by semiconductor-detector X-ray spectrometers. A new guard-ring detector is used with appropriate circuits to reduce background by a large factor. We discuss the sensitivity of the new arrangement with various excitation sources.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 470 - 482
Copyright
Copyright © International Centre for Diffraction Data 1971

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References

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5. Goulding, F. S. and Jaklevic, J. M., “Trace Element Analysis by X-ray Fluorescence”, Lawrence Radiation Laboratory Report No. UCRL-20625, Berkeley, California 94720.Google Scholar
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