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Instrumental Capabilites in X-Ray Diffraction Analysis: Comparative Techniques

Published online by Cambridge University Press:  06 March 2019

P. J. Kincaid ,
R. A. Newman  and
T. G. Fawcett
P. J. Kincaid
Affiliation:
Michigan Applied Science and Technology Laboratories, The Dow Chemical Company, Midland, MI 48674
R. A. Newman
Affiliation:
Michigan Applied Science and Technology Laboratories, The Dow Chemical Company, Midland, MI 48674
T. G. Fawcett
Affiliation:
Michigan Applied Science and Technology Laboratories, The Dow Chemical Company, Midland, MI 48674
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Extract

The following study is an evaluation of several different types of instrumentation available for use in powder x-ray diffraction work. The particular units used are those at the Dow Chemical Company x-ray diffraction lab. The variety of instrumentation allows analyses from routine phase identification to more specialized work such as low-angle x-ray diffraction of polymers and high-resolution analysis for cell parameter refinements.

The purpose of this work is to compare the relative capabilities of these different instruments under typical day-to-day operating conditions. While not a comprehensive study, the conclusions drawn should be applicable to powder x-ray diffraction in general.

Type
VIII. Advances in XRD Instrumentation and Procedures
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 407 - 412
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. Brown, A. and Edmonds, J.W., Adv. in X-Ray Analysis, 23, 361 (1980).Google Scholar
2. Newman, R.A., Kirchhoff, P. Moore, and “Fawcett, T. G., Adv. in X-Ray Analysis, 27, 261 (1984). Since this publication, slits have been added to the Guinier/PSD System which further increases resolution. However, at best the Guinier/PSD. System is still not equivalent to film.Google Scholar
3. Schreiner, W.N. and Fawcett, T.G., Adv. in X-Ray Analysis, 28, 309 (1985).Google Scholar