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Measurement Of Relative X-Ray Intensity Ratios for Elements With Z=14 to 92 Using EDXRF Spectrometer

Published online by Cambridge University Press:  06 March 2019

Krassimir N. Stoev  and
Joseph F. Dlouhy
Krassimir N. Stoev
Affiliation:
River Road Environmental Technology Centre 3439 River Road, Ottawa, Canada K1A 0H3
Joseph F. Dlouhy
Affiliation:
River Road Environmental Technology Centre 3439 River Road, Ottawa, Canada K1A 0H3
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Extract

Nowadays x-ray fluorescence analysis is one of the major techniques for determination of trace elements. Vacuum operated Si (Li) .energy-dispersive x-ray spectrometers can analyze simultaneously up to 50 elements from Na (Z=11) to U (Z = 92) . Proper interpretation of the accumulated spectra requires correct solution of x-ray line overlap problems. In many cases knowledge of x-ray intensity ratios can make the procedure for resolving the overlapped peaks more reliable and reproducible. Measurements of radiative transition rates can also provide fundamental tests of theoretical atomic structure calculations. There are many other useful applications of x-ray emission rates in theoretical and experimental physics. On the other hand, there are differences in the published data, which suggests that x-ray intensity ratios are still not known with the necessary accuracy, and new measurements are useful and necessary.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 697 - 709
Copyright
Copyright © International Centre for Diffraction Data 1993

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