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A New Focusing Vacuum X-Ray Macroprobe Analyzer

Published online by Cambridge University Press:  06 March 2019

James A. Dunne
James A. Dunne*
Affiliation:
Philips Electronic Instruments Mount Vernon, New York
*
*Present address: Jet Propulsion Laboratory, Pasadena, California.
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Abstract

A new X-ray probe attachment for the standard Norelco Vacuum Spectrograph has been developed. The X-ray optical design is essentially the same as that of the Norelco/AMR Microprobe goniometer, being an Ogilvie-type varying curvature Johann focusing device. A light optical system which allows the examination of the specimen during analysis is incorporated in a prealigned module along with the X-ray beam defining aperture. This arrangement assures a constant relationship between beam and optical field centers. Apertures ranging in diameter from 50–500 μ are provided. Data are presented giving the effective size of the specimen area analyzed using each of these apertures. A detailed description of the component parts of the instrument is given.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 223 - 230
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

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