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Recent Developments and Results in Total Reflection X-ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

Peter Wobrauschek ,
Peter Kregsamer ,
Christina Streli  and
Hannes Aiginger
Peter Wobrauschek
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Peter Kregsamer
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Christina Streli
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
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Abstract

In the last years Total Reflection X-Ray Fluorescence spectroscopy (TXRF) has shown to be an analytical technique for trace element analysis as well as surface quality control. Detection limits in the range of pg or ng/g (ppb) level in concentration values of aqueous solutions or 1011 -109 atoms/cm2 are achieved with new excitation sources. The range of detectable elements has been extended to low and high 2 elements. Instrumental developments and results of the Atominstitut as well as from some other working groups are presented.

Information

Type
I. Surface and Near-Surface X-Ray Spectroscopy
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 1 - 12
Copyright
Copyright © International Centre for Diffraction Data 1990

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